Title :
Numerical analysis of near-infrared wave propagation characteristics in dielectric-coated parallel planar microstructural waveguides
Author :
Van Petegem, Wim E A ; James, C. Robert ; Vermeulen, Fred E. ; Robinson, Alexander M.
fDate :
3/1/1997 12:00:00 AM
Abstract :
In this paper, the properties of electromagnetic (EM) wave propagation in layered planar microstructural waveguides are investigated. Analytical and numerical results are presented on the propagation of a 1-μm EM wave in a parallel planar waveguide. Its walls are made of Au or Si, coated with a thin layer of SiO2 and separated by a fluid. The propagation characteristics of even and odd TE and TM modes are described as a function of the coating thickness. It is shown that the propagation of TE modes exhibits a sudden shift in power flow distribution from the fluid to the coating when the coating thickness exceeds a critical value. This property may be exploited for micromachined sensor applications. TM modes do not exhibit this behaviour
Keywords :
coplanar waveguides; microsensors; submillimetre wave propagation; waveguide theory; 1 micrometre; Au-SiO2; Si-SiO2; TE modes; TM modes; coating thickness; coplanar waveguides; dielectric-coated parallel planar microstructural waveguides; micromachined sensor applications; near-infrared wave propagation characteristics; power flow distribution; propagation characteristics; submillimeter wave propagation; Coatings; Dielectrics; Electromagnetic propagation; Electromagnetic waveguides; Gold; Numerical analysis; Optical waveguides; Planar waveguides; Silicon; Tellurium;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on