• DocumentCode
    1376868
  • Title

    n-Type Metal-Base Organic Transistor

  • Author

    Yusoff, Abd Rashid bin Mohd ; Song, Ying ; Schulz, Dietmar ; Holz, Eikner ; Shuib, Saiful Anuar

  • Author_Institution
    Dept. de Fis., Univ. Fed. do Parana, Curitiba, Brazil
  • Volume
    11
  • Issue
    2
  • fYear
    2012
  • fDate
    3/1/2012 12:00:00 AM
  • Firstpage
    352
  • Lastpage
    354
  • Abstract
    This investigation proposes an Ir(ppy)3/Ir(mpp)3 double-emitter heterojuction metal-base transistors grown by vacuum sublimation deposition. The improved structure exhibits the advantages of high ON-to-OFF current ratio 4.98 × 106 and high current gains (β) 355.6. The device survived for almost two months with a slight dropped in these parameters before it is completely gone in four months. Furthermore, this study elucidates the relation between leakage current, current gains, and ON-to-OFF current ratio.
  • Keywords
    bipolar transistors; leakage currents; organic compounds; current gains; double-emitter heterojunction metal-base transistors; improved structure; leakage current; n-type metal-base organic transistor; on-off current ratio; tris(2-phenylpyridinato-N,C2´)iridium (III); tris(3-methyl-2-phenylpyridine)iridium (III); vacuum sublimation deposition; Current measurement; Fabrication; Leakage current; Performance evaluation; Semiconductor device measurement; Silicon; Transistors; Bipolar transistor; iridium complexes; metal-base transistor (MBT);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2011.2173210
  • Filename
    6081978