• DocumentCode
    1377043
  • Title

    Architecture drives test system standards

  • Author

    Mueller, Joe ; Oblad, Roger

  • Author_Institution
    Agilent Technol Inc., Loveland, CO, USA
  • Volume
    37
  • Issue
    9
  • fYear
    2000
  • fDate
    9/1/2000 12:00:00 AM
  • Firstpage
    68
  • Lastpage
    73
  • Abstract
    To automate test and measurement systems in R&D and manufacturing settings, it is common practice to connect the instruments to computers. With modern programming languages and a simple setup, the task is no harder than calling up a simple function. The only remarkable aspect is that this function communicates with a hardware device that either measures or stimulates some aspect of the physical world. Grouping the functions needed for controlling an instrument forms a library, which is called an instrument driver. Above all, instrument drivers are convenient. They can be used to build test and measurement systems having interchangeable elements, so that the systems can be maintained through, and despite, changes in the computer, the instruments, and the device under test (DUT). Basically, the drivers encapsulate the various I/O operations between computer and instrument. They are also a convenient interface for those test programs that use instruments. And-an important benefit-they help to insulate the test system from changes made in the underlying instrument hardware. In theory, a test engineer should be able to exchange a new instrument for an existing one within a system and reconfigure that system to use the appropriate driver. In practice, further work is unavoidable before the system will behave as it did before the exchange. Several solutions are being considered by instrument vendors and end-users, including exactly how to exchange instruments within a system, and to what standards a particular driver or system should conform
  • Keywords
    automatic test equipment; measurement standards; peripheral interfaces; GPIB; I/O operations; R&D; communication; device under test; hardware device; instrument driver; instrument hardware; interchangeable elements; interface; manufacturing; programming languages; test and measurement systems automation; test system standards; Automatic testing; Computer aided manufacturing; Computer architecture; Computer languages; Hardware; Instruments; Insulation; Libraries; Manufacturing automation; System testing;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/6.866287
  • Filename
    866287