DocumentCode
1377043
Title
Architecture drives test system standards
Author
Mueller, Joe ; Oblad, Roger
Author_Institution
Agilent Technol Inc., Loveland, CO, USA
Volume
37
Issue
9
fYear
2000
fDate
9/1/2000 12:00:00 AM
Firstpage
68
Lastpage
73
Abstract
To automate test and measurement systems in R&D and manufacturing settings, it is common practice to connect the instruments to computers. With modern programming languages and a simple setup, the task is no harder than calling up a simple function. The only remarkable aspect is that this function communicates with a hardware device that either measures or stimulates some aspect of the physical world. Grouping the functions needed for controlling an instrument forms a library, which is called an instrument driver. Above all, instrument drivers are convenient. They can be used to build test and measurement systems having interchangeable elements, so that the systems can be maintained through, and despite, changes in the computer, the instruments, and the device under test (DUT). Basically, the drivers encapsulate the various I/O operations between computer and instrument. They are also a convenient interface for those test programs that use instruments. And-an important benefit-they help to insulate the test system from changes made in the underlying instrument hardware. In theory, a test engineer should be able to exchange a new instrument for an existing one within a system and reconfigure that system to use the appropriate driver. In practice, further work is unavoidable before the system will behave as it did before the exchange. Several solutions are being considered by instrument vendors and end-users, including exactly how to exchange instruments within a system, and to what standards a particular driver or system should conform
Keywords
automatic test equipment; measurement standards; peripheral interfaces; GPIB; I/O operations; R&D; communication; device under test; hardware device; instrument driver; instrument hardware; interchangeable elements; interface; manufacturing; programming languages; test and measurement systems automation; test system standards; Automatic testing; Computer aided manufacturing; Computer architecture; Computer languages; Hardware; Instruments; Insulation; Libraries; Manufacturing automation; System testing;
fLanguage
English
Journal_Title
Spectrum, IEEE
Publisher
ieee
ISSN
0018-9235
Type
jour
DOI
10.1109/6.866287
Filename
866287
Link To Document