DocumentCode :
1377220
Title :
Zn-Diffusion InAs Photodiodes on a Semi-Insulating GaAs Substrate for High-Speed and Low Dark-Current Performance
Author :
Shi, J.-W. ; Kuo, F.-M. ; Huang, B.-R.
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Chungli, Taiwan
Volume :
23
Issue :
2
fYear :
2011
Firstpage :
100
Lastpage :
102
Abstract :
We demonstrate Zn-diffusion InAs-based high-speed photodiodes (PDs) fabricated on semi-insulating (S.I.) GaAs substrates. The Zn-diffusion profile in our PDs is used to minimize the influence of the surface-state on the dark current, which is an issue for small (high-speed) InAs PDs with a large surface-to-volume ratio. Compared to control without Zn-diffusion, our device exhibits a much lower dark current. In addition, as compared to the performance reported for InAs PDs on conductive InAs substrates, our PDs on S.I. substrates demonstrate a lower parasitic capacitance and have a superior capability for being integrated with other microwave components. The measured optical-to-electrical (O-E) bandwidth of our device can be as wide as 20 GHz with a reasonable dark current density ( ~ 50 A/cm2) at room temperature. Based on our modeling results, the measured bandwidths are limited by the internal electron drift/diffusion time due to the intervalley scattering effect under 1.55-μm wavelength excitation.
Keywords :
III-V semiconductors; capacitance; dark conductivity; electromigration; high-speed optical techniques; indium compounds; integrated optics; optical fabrication; photodiodes; surface scattering; surface states; zinc; GaAs; InAs:Zn; electron diffusion; high-speed photodiodes; integrated systems; internal electron drift; intervalley scattering effect; low dark-current properties; microwave components; optical fabrication; optical-to-electrical bandwidth; parasitic capacitance; semiinsulating substrate; surface-state; surface-to-volume ratio; temperature 293 K to 298 K; wavelength 1.55 mum; Bandwidth; Current measurement; Dark current; Frequency measurement; Gallium arsenide; Performance evaluation; Substrates; InAs; Zn-diffusion; photodiodes;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2010.2091679
Filename :
5634077
Link To Document :
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