DocumentCode
1377453
Title
Application of statistical techniques to electron tubes for use in a 4,000-mile transmission system
Author
Van Haste, W.
Author_Institution
Bell Telephone Laboratories, Inc., Allentown, Pa.
Volume
75
Issue
1
fYear
1956
fDate
3/1/1956 12:00:00 AM
Firstpage
50
Lastpage
54
Abstract
OVER the past several years the subject of reliability of electronic equipment has received considerable attention. Much has been written on the need for reliable systems, and the mathematical probabilities of component performance have been explored. While there have been demonstrations of achievement, it is felt that additional material of this nature will be of interest. One of the chief factors in establishing a reliable system is to assure compatibility of the operating environment and the capabilities of the active electronic device. This can best be brought about by close cooperation between the equipment and component designers.
Keywords
Correlation; Electron tubes; Integrated circuit reliability; Laboratories; Transconductance; Wires;
fLanguage
English
Journal_Title
American Institute of Electrical Engineers, Part I: Communication and Electronics, Transactions of the
Publisher
ieee
ISSN
0097-2452
Type
jour
DOI
10.1109/TCE.1956.6372481
Filename
6372481
Link To Document