• DocumentCode
    1377453
  • Title

    Application of statistical techniques to electron tubes for use in a 4,000-mile transmission system

  • Author

    Van Haste, W.

  • Author_Institution
    Bell Telephone Laboratories, Inc., Allentown, Pa.
  • Volume
    75
  • Issue
    1
  • fYear
    1956
  • fDate
    3/1/1956 12:00:00 AM
  • Firstpage
    50
  • Lastpage
    54
  • Abstract
    OVER the past several years the subject of reliability of electronic equipment has received considerable attention. Much has been written on the need for reliable systems, and the mathematical probabilities of component performance have been explored. While there have been demonstrations of achievement, it is felt that additional material of this nature will be of interest. One of the chief factors in establishing a reliable system is to assure compatibility of the operating environment and the capabilities of the active electronic device. This can best be brought about by close cooperation between the equipment and component designers.
  • Keywords
    Correlation; Electron tubes; Integrated circuit reliability; Laboratories; Transconductance; Wires;
  • fLanguage
    English
  • Journal_Title
    American Institute of Electrical Engineers, Part I: Communication and Electronics, Transactions of the
  • Publisher
    ieee
  • ISSN
    0097-2452
  • Type

    jour

  • DOI
    10.1109/TCE.1956.6372481
  • Filename
    6372481