• DocumentCode
    1377502
  • Title

    Supershort Avalanche Electron Beams and X-rays in Atmospheric-Pressure Air

  • Author

    Tarasenko, Victor F. ; Baksht, Evgenii Kh ; Burachenko, Alexander G. ; Kostyrya, Igor D. ; Lomaev, Mikhail I. ; Rybka, Dmitri V.

  • Author_Institution
    Lab. of Opt. Radiat., Siberian Branch of the Russian Acad. of Sci. (SB RAS), Tomsk, Russia
  • Volume
    38
  • Issue
    4
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    741
  • Lastpage
    750
  • Abstract
    The conditions for the generation of runaway electron beams with maximum amplitudes and soft X-rays with maximum exposure doses in a nanosecond discharge in atmospheric-pressure air were determined. A supershort avalanche electron beam (SAEB) with a current of amplitude ~50 A, a current pulse of full-width at half-maximum (FWHM) ~ 100 ps, and a current density up to 20 A/cm2 was recorded downstream of the gas diode foil. It is shown that the maximum of the SAEB current amplitude shifts in time relative to the voltage pulse rise as a collector is displaced over the foil surface. A source of soft X-rays with an FWHM of less than 200 ps and an exposure doze of ~3 mR per pulse was designed based on a SLEP-150 pulser (maximum voltage amplitude ~140 kV, FWHM ~1 ns, and pulse rise time ~0.3 ns). It is demonstrated that X-ray quanta with an effective energy of ~9 keV make a major contribution to the exposure dose.
  • Keywords
    electron avalanches; plasma X-ray sources; plasma density; plasma diodes; plasma production; plasma-beam interactions; X-ray quanta; atmospheric-pressure air; current amplitude shifts; current density; current pulse; gas diode foil; maximum voltage amplitude; nanosecond discharge; pressure 1 atm; soft X-ray source; supershort avalanche electron beams; Diffuse discharge; electron beams in gases; runaway electrons; soft X-rays;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2009.2037908
  • Filename
    5373876