• DocumentCode
    1377676
  • Title

    Growth and characterisation of mid-IR InAs0.9Sb0.1 -InAs strained multiple quantum well light emitting diodes grown on InAs substrates

  • Author

    Grietens, B. ; Németh, S. ; Van Hoof, C. ; Van Daele, P. ; Borghs, G.

  • Author_Institution
    IMEC, Leuven, Belgium
  • Volume
    144
  • Issue
    5
  • fYear
    1997
  • fDate
    10/1/1997 12:00:00 AM
  • Firstpage
    295
  • Lastpage
    298
  • Abstract
    Molecular beam epitaxy (MBE) has been used to grow strained multiple quantum well InAs0.9Sb0.1 light-emitting diodes (LEDs) lattice matched on InAs substrates. The LEDs exhibit room-temperature infrared emission at 3.4 μm and can be used to fabricate low cost sensors for the detection or monitoring of any C-H containing compound. The compositional dependence of InAsSb on the As 2 over Sb4 flux ratio has been examined and could be fitted using an empirical expression based on the As2 and Sb4 fluxes and on their relative sticking coefficients. Electroluminescence has been measured at room temperature and at liquid nitrogen temperature. The low temperature spectra peak at 3.4 μm (InAs) and at 3.8 μm (InAs0.9Sb0.1). At room temperature only InAs emission is observed. The external efficiencies at room temperature were 1.0×10-4, and the maximum output power was 27.5 μW under pulsed operation at 740 mA (30 kHz, 0.6% duty cycle)
  • Keywords
    III-V semiconductors; electroluminescence; gas sensors; indium compounds; infrared sources; light emitting diodes; molecular beam epitaxial growth; optical fabrication; optical sensors; 27.5 muW; 3.4 mum; 3.8 mum; 740 mA; C-H; InAs substrates; InAs0.9Sb0.1 light-emitting diodes; InAs0.9Sb0.1-InAs; LEDs; MBE; Sb4 flux ratio; Sb4 fluxes; compositional dependence; electroluminescence; empirical expression; lattice matched; low cost sensors; low temperature spectra; maximum output power; mid-IR InAs0.9Sb0.1/InAs strained multiple quantum well light emitting diodes; molecular beam epitaxy; monitoring; pulsed operation; relative sticking coefficients; strained multiple quantum well;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:19971255
  • Filename
    674331