DocumentCode
1377676
Title
Growth and characterisation of mid-IR InAs0.9Sb0.1 -InAs strained multiple quantum well light emitting diodes grown on InAs substrates
Author
Grietens, B. ; Németh, S. ; Van Hoof, C. ; Van Daele, P. ; Borghs, G.
Author_Institution
IMEC, Leuven, Belgium
Volume
144
Issue
5
fYear
1997
fDate
10/1/1997 12:00:00 AM
Firstpage
295
Lastpage
298
Abstract
Molecular beam epitaxy (MBE) has been used to grow strained multiple quantum well InAs0.9Sb0.1 light-emitting diodes (LEDs) lattice matched on InAs substrates. The LEDs exhibit room-temperature infrared emission at 3.4 μm and can be used to fabricate low cost sensors for the detection or monitoring of any C-H containing compound. The compositional dependence of InAsSb on the As 2 over Sb4 flux ratio has been examined and could be fitted using an empirical expression based on the As2 and Sb4 fluxes and on their relative sticking coefficients. Electroluminescence has been measured at room temperature and at liquid nitrogen temperature. The low temperature spectra peak at 3.4 μm (InAs) and at 3.8 μm (InAs0.9Sb0.1). At room temperature only InAs emission is observed. The external efficiencies at room temperature were 1.0×10-4, and the maximum output power was 27.5 μW under pulsed operation at 740 mA (30 kHz, 0.6% duty cycle)
Keywords
III-V semiconductors; electroluminescence; gas sensors; indium compounds; infrared sources; light emitting diodes; molecular beam epitaxial growth; optical fabrication; optical sensors; 27.5 muW; 3.4 mum; 3.8 mum; 740 mA; C-H; InAs substrates; InAs0.9Sb0.1 light-emitting diodes; InAs0.9Sb0.1-InAs; LEDs; MBE; Sb4 flux ratio; Sb4 fluxes; compositional dependence; electroluminescence; empirical expression; lattice matched; low cost sensors; low temperature spectra; maximum output power; mid-IR InAs0.9Sb0.1/InAs strained multiple quantum well light emitting diodes; molecular beam epitaxy; monitoring; pulsed operation; relative sticking coefficients; strained multiple quantum well;
fLanguage
English
Journal_Title
Optoelectronics, IEE Proceedings -
Publisher
iet
ISSN
1350-2433
Type
jour
DOI
10.1049/ip-opt:19971255
Filename
674331
Link To Document