DocumentCode
1377719
Title
Auger recombination in strained quantum well InAlAsSb/GaSb structures for 3-4 μm lasers
Author
Andreev, A.D. ; Zegrya, G.G.
Author_Institution
A.F. Ioffe Physicotech. Inst., Acad. of Sci., St. Petersburg, Russia
Volume
144
Issue
5
fYear
1997
fDate
10/1/1997 12:00:00 AM
Firstpage
336
Lastpage
342
Abstract
Thresholdless Auger recombination in InAlAsSb strained quantum wells is studied theoretically. Analytical formulas for the Auger transition matrix element have been derived in the framework of the Kane model. A detailed analysis of overlap integrals between initial and final states of carriers has shown that the strain and light-heavy hole mixing affect both qualitatively and quantitatively the overlap integral between the electron and hole states. The Auger recombination coefficient is found to have a strong dependence on strain, quantum well width and emission wavelength, but weak dependence on temperature. The Auger coefficient temperature dependence is shown to be very sensitive to the bandgap variation with temperature
Keywords
Auger effect; III-V semiconductors; aluminium compounds; electron-hole recombination; gallium compounds; indium compounds; infrared sources; laser theory; laser transitions; quantum well lasers; semiconductor device models; semiconductor quantum wells; Auger coefficient temperature dependence; Auger recombination; Auger recombination coefficient; Auger transition matrix; InAlAsSb-GaSb; InAlAsSb/GaSb structures; Kane model; analytical formulas; bandgap variation; electron states; emission wavelength; hole states; light-heavy hole mixing; overlap integral; overlap integrals; quantum well width; strained quantum well; thresholdless Auger recombination;
fLanguage
English
Journal_Title
Optoelectronics, IEE Proceedings -
Publisher
iet
ISSN
1350-2433
Type
jour
DOI
10.1049/ip-opt:19971314
Filename
674338
Link To Document