• DocumentCode
    1377719
  • Title

    Auger recombination in strained quantum well InAlAsSb/GaSb structures for 3-4 μm lasers

  • Author

    Andreev, A.D. ; Zegrya, G.G.

  • Author_Institution
    A.F. Ioffe Physicotech. Inst., Acad. of Sci., St. Petersburg, Russia
  • Volume
    144
  • Issue
    5
  • fYear
    1997
  • fDate
    10/1/1997 12:00:00 AM
  • Firstpage
    336
  • Lastpage
    342
  • Abstract
    Thresholdless Auger recombination in InAlAsSb strained quantum wells is studied theoretically. Analytical formulas for the Auger transition matrix element have been derived in the framework of the Kane model. A detailed analysis of overlap integrals between initial and final states of carriers has shown that the strain and light-heavy hole mixing affect both qualitatively and quantitatively the overlap integral between the electron and hole states. The Auger recombination coefficient is found to have a strong dependence on strain, quantum well width and emission wavelength, but weak dependence on temperature. The Auger coefficient temperature dependence is shown to be very sensitive to the bandgap variation with temperature
  • Keywords
    Auger effect; III-V semiconductors; aluminium compounds; electron-hole recombination; gallium compounds; indium compounds; infrared sources; laser theory; laser transitions; quantum well lasers; semiconductor device models; semiconductor quantum wells; Auger coefficient temperature dependence; Auger recombination; Auger recombination coefficient; Auger transition matrix; InAlAsSb-GaSb; InAlAsSb/GaSb structures; Kane model; analytical formulas; bandgap variation; electron states; emission wavelength; hole states; light-heavy hole mixing; overlap integral; overlap integrals; quantum well width; strained quantum well; thresholdless Auger recombination;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:19971314
  • Filename
    674338