• DocumentCode
    1377850
  • Title

    Floating Body Effect in Partially Depleted Silicon Nanowire Transistors and Potential Capacitor-Less One-Transistor DRAM Applications

  • Author

    Lee, Myeongwon ; Moon, Taeho ; Kim, Sangsig

  • Author_Institution
    Dept. of Electr. Eng., Korea Univ., Seoul, South Korea
  • Volume
    11
  • Issue
    2
  • fYear
    2012
  • fDate
    3/1/2012 12:00:00 AM
  • Firstpage
    355
  • Lastpage
    359
  • Abstract
    We present a capacitor-less 1T-DRAM cell on SiO2 /Si substrates using a silicon nanowire (SiNW) as the channel material. The SiNWs are fabricated by a top-down route that is fully compatible with the current Si-based CMOS technology. Based on the observation of the floating body effect of a partially depleted (PD) silicon nanowire transistor (SNWT), its 1T-DRAM functionality and reliability characteristics are investigated. By virtue of the top-down route providing a printable form of the inverted triangular SiNWs, the PD SNWT 1T-DRAM cell can be applied on insulating plastic substrates for potential applications of flexible electronics.
  • Keywords
    CMOS memory circuits; DRAM chips; MOSFET; flexible electronics; nanowires; silicon compounds; CMOS technology; PD SNWT 1T-DRAM cell; SiO2-Si; capacitor-less 1T-DRAM cell; channel material; flexible electronics; floating body effect; partially depleted silicon nanowire transistors; potential capacitorless one-transistor DRAM applications; top-down route; CMOS integrated circuits; Logic gates; Random access memory; Silicon; Substrates; Threshold voltage; Transistors; 1T-DRAM; Capacitor-less; floating body effect; partially depleted (PD); silicon nanowire transistor (SNWT);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2011.2175942
  • Filename
    6082450