DocumentCode
1377850
Title
Floating Body Effect in Partially Depleted Silicon Nanowire Transistors and Potential Capacitor-Less One-Transistor DRAM Applications
Author
Lee, Myeongwon ; Moon, Taeho ; Kim, Sangsig
Author_Institution
Dept. of Electr. Eng., Korea Univ., Seoul, South Korea
Volume
11
Issue
2
fYear
2012
fDate
3/1/2012 12:00:00 AM
Firstpage
355
Lastpage
359
Abstract
We present a capacitor-less 1T-DRAM cell on SiO2 /Si substrates using a silicon nanowire (SiNW) as the channel material. The SiNWs are fabricated by a top-down route that is fully compatible with the current Si-based CMOS technology. Based on the observation of the floating body effect of a partially depleted (PD) silicon nanowire transistor (SNWT), its 1T-DRAM functionality and reliability characteristics are investigated. By virtue of the top-down route providing a printable form of the inverted triangular SiNWs, the PD SNWT 1T-DRAM cell can be applied on insulating plastic substrates for potential applications of flexible electronics.
Keywords
CMOS memory circuits; DRAM chips; MOSFET; flexible electronics; nanowires; silicon compounds; CMOS technology; PD SNWT 1T-DRAM cell; SiO2-Si; capacitor-less 1T-DRAM cell; channel material; flexible electronics; floating body effect; partially depleted silicon nanowire transistors; potential capacitorless one-transistor DRAM applications; top-down route; CMOS integrated circuits; Logic gates; Random access memory; Silicon; Substrates; Threshold voltage; Transistors; 1T-DRAM; Capacitor-less; floating body effect; partially depleted (PD); silicon nanowire transistor (SNWT);
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2011.2175942
Filename
6082450
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