DocumentCode :
1378038
Title :
Bias in robust estimation caused by discontinuities and multiple structures
Author :
Stewart, Charles V.
Author_Institution :
Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
19
Issue :
8
fYear :
1997
fDate :
8/1/1997 12:00:00 AM
Firstpage :
818
Lastpage :
833
Abstract :
When fitting models to data containing multiple structures, such as when fitting surface patches to data taken from a neighborhood that includes a range discontinuity, robust estimators must tolerate both gross outliers and pseudo outliers. Pseudo outliers are outliers to the structure of interest, but inliers to a different structure. They differ from gross outliers because of their coherence. Such data occurs frequently in computer vision problems, including motion estimation, model fitting, and range data analysis. The focus in this paper is the problem of fitting surfaces near discontinuities in range data. To characterize the performance of least median of the squares, least trimmed squares, M-estimators, Hough transforms, RANSAC, and MINPRAN on this type of data, the “pseudo outlier bias” metric is developed using techniques from the robust statistics literature, and it is used to study the error in robust fits caused by distributions modeling various types of discontinuities. The results show each robust estimator to be biased at small, but substantial, discontinuities. They also show the circumstances under which different estimators are most effective. Most importantly, the results imply present estimators should be used with care, and new estimators should be developed
Keywords :
computer vision; estimation theory; minimisation; motion estimation; parameter estimation; statistical analysis; surface fitting; Hough transforms; M-estimators; MINPRAN; RANSAC; computer vision; discontinuities; gross outliers; least median of the squares; least trimmed squares; model fitting; motion estimation; multiple structures; pseudo outlier bias; pseudo outliers; range data analysis; range discontinuity; robust estimation; robust fits; robust statistics; surface fitting; Coherence; Computer vision; Data analysis; Error analysis; Frequency estimation; Motion estimation; Parameter estimation; Robustness; Statistical distributions; Surface fitting;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.608280
Filename :
608280
Link To Document :
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