DocumentCode :
1378091
Title :
Plasmonic Light Beaming Manipulation and its Detection Using Holographic Microscopy
Author :
Lim, Yongjun ; Hahn, Joonku ; Kim, Seyoon ; Park, Junghyun ; Kim, Hwi ; Lee, Byoungho
Author_Institution :
Nat. Creative Res. Center for Active Plasmonics Applic. Syst., Seoul Nat. Univ., Seoul, South Korea
Volume :
46
Issue :
3
fYear :
2010
fDate :
3/1/2010 12:00:00 AM
Firstpage :
300
Lastpage :
305
Abstract :
Plasmonic off axis beaming and focusing of light by the use of asymmetric or non-periodic dielectric gratings around a metallic slit are experimentally demonstrated. The far-field probing was done by holographic microscopy. While the conventional near-field microscopes can probe only near-fields, our four-step phase-shift interferometer provides an efficient way of probing and reconstructing light paths coming out from the plasmonic devices. We hope our experimental work contributes to the practical applications of plasmonics such as optical interconnection and optical data storage.
Keywords :
diffraction gratings; holographic interferometry; laser beams; optical focusing; optical microscopy; plasmonics; dielectric gratings; far-field probing; four-step phase-shift interferometer; holographic microscopy; light focusing; metallic slit; near-field microscopes; optical data storage; optical interconnection; plasmonic devices; plasmonic light beaming manipulation; Dielectrics; Gratings; Holographic optical components; Holography; Microscopy; Optical interconnections; Optical interferometry; Phase shifting interferometry; Plasmons; Probes; Holographic interferometry; plasmonics; surface plasmons;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2009.2033717
Filename :
5373962
Link To Document :
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