Title :
Dynamic digital integrated circuit testing using oscillation-test method
Author :
Arabi, K. ; Ihs, H. ; Dufaza, C. ; Kaminska, Bozena
Author_Institution :
Opmaxx Inc., Beaverton, OR
fDate :
4/16/1998 12:00:00 AM
Abstract :
A new technique to deal with simultaneous testing of delay and stuck-at faults in digital integrated circuits is proposed. It consists of sensitising a path in the digital circuit under test and then incorporating it in a ring oscillator to test for delay and stuck-at faults in the path. This procedure should be exercised for all, or at least critical paths in the circuit. This test technique can be used along with scan techniques or implemented as a complete built-in self-test solution
Keywords :
circuit oscillations; delays; digital integrated circuits; integrated circuit testing; logic testing; BIST; built-in self-test; delay faults; digital integrated circuit testing; dynamic digital IC testing; oscillation-test method; ring oscillator; scan techniques; simultaneous testing; stuck-at faults;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19980529
