DocumentCode
1378413
Title
Modeling and Design Methodology of High-Efficiency Class-F and Class-
Power Amplifiers
Author
Kim, Joon Hyung ; Jo, Gweon Do ; Oh, Jung Hoon ; Kim, Young Hoon ; Lee, Kwang Chun ; Jung, Jae Ho
Author_Institution
Mobile RF Team, Electron. & Telecommun. Res. Inst. (ETRI), Daejeon, South Korea
Volume
59
Issue
1
fYear
2011
Firstpage
153
Lastpage
165
Abstract
In this paper, efficiency-limiting physical constraint effects imposed on the knee voltage, along with a variation of the optimum load resistance, are investigated for highly efficient Class-F and Class- amplifiers. First, for an accurate analysis and comparison, new current waveform models are identified, and a realistic approach incorporated using a nonzero knee voltage and voltage-dependent nonlinear capacitance is employed to derive the voltage waveforms of the amplifiers. An analysis is performed to show the efficiency, output power, power gain, and output power compression points for both modes. Using this knowledge, along with a complete performance comparison, we provide a direction for optimizing the amplifier design. The analytic results are further verified based on the measured results of 3.54-GHz Class-F and Class- amplifiers using a commercial 60-W peak-to-envelope power gallium-nitride device. The experimental results show that Class-F and Class- amplifiers operate at drain efficiencies of 69.9% and 69.4% at saturated output powers of 47.4 and 47.2 dBm, respectively. These remarkably similar performances have excellent agreement with the predicted analysis at our operational frequency.
Keywords
capacitance; power amplifiers; class-F power amplifiers; class-F-1 power amplifiers; efficiency-limiting physical constraint effects; knee voltage; voltage-dependent nonlinear capacitance; FETs; Frequency conversion; Harmonic analysis; Impedance; Knee; Power generation; Voltage control; Class-F power amplifier (PA); inverse Class-F PA; nonlinear capacitance; on-resistance;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2010.2090167
Filename
5635372
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