DocumentCode :
1378834
Title :
Suppression of leakage current in InGaAsP/InP buried heterostructure lasers by InAlAs strained current-blocking layers
Author :
Ohtoshi, T. ; Chinone, N.
Author_Institution :
Central Res. Lab., Tokyo, Japan
Volume :
27
Issue :
1
fYear :
1991
Firstpage :
12
Lastpage :
13
Abstract :
InGaAsP/InP buried heterostructure (BH) lasers with InAlAs strained current-blocking layers are proposed. For use as a current-blocking material with a bandgap energy larger than that of InP, InAlAs is superior to InGaP. This is because a wide bandgap can be obtained in the InAlAs without large bandgap shrinkage caused by tensile strain. A two-dimensional simulation shows that the leakage current in BH lasers with thin pnpn blocking layers is suppressed up to 85 degrees C by employing 100 AA In1-xAlxAs(x>or=0.54) layers.
Keywords :
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; leakage currents; semiconductor junction lasers; 100 AA; 2D simulations; 85 degC; InAlAs; InGaAsP-InP buried heterostructure lasers; bandgap energy; bandgap shrinkage; leakage current suppression; strained current-blocking layers; tensile strain; thin pnpn blocking layers; wide bandgap;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19910008
Filename :
60836
Link To Document :
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