Title :
Design of totally self-checking embedded two-rail code checkers
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
Abstract :
The author addresses the problem of designing totally self-checking checkers for checking m two-rail signal pairs, when the checker receives a subset of all possible input codewords, under normal operation. There are cases when a two-rail checker tree, which will be tested by the inputs received under normal operation, cannot be found. However, it is shown that two-rail checker network structures other than trees will also be totally self-checking (TSC) and code-disjoint. A method for designing TSC two-rail checkers for a given set of input codewords is presented.
Keywords :
combinatorial circuits; error detection codes; logic testing; combinational checker circuit; input codewords; single stuck faults; totally self-checking embedded two-rail code checkers; two-rail checker tree; two-rail signal pairs;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910241