Title :
Data transmission testing set
Author :
Boughtwood, J. E. ; Christie, T. A.
Author_Institution :
Western Union Telegraph Company, New York, N. Y.
Abstract :
This paper describes a transmission testing set for high-speed data circuits. The set is an electronic, transistorized device intended primarily for laboratory use in the development of binary data transmission systems.
Keywords :
Distortion measurement; Electron tubes; Inductors; Oscillators; Pulse measurements; Switches; Testing;
Journal_Title :
American Institute of Electrical Engineers, Part I: Communication and Electronics, Transactions of the
DOI :
10.1109/TCE.1958.6372767
