Title :
RT-level ITC´99 benchmarks and first ATPG results
Author :
Corno, Fulvio ; Reorda, Matteo Sonza ; Squillero, Giovanni
Author_Institution :
Politecnico di Torino, Italy
Abstract :
New design flows require reducing work at the gate level and performing most activities before the synthesis step, including evaluation of testability of circuits. We propose a suite of RT-level benchmarks that help improve research in high-level ATPG tools. First results on the benchmarks obtained with our prototype tool show the feasibility of the approach
Keywords :
Automatic test pattern generation; Logic testing; Performance evaluation; ATPG; ATPG tools; RT-level benchmarks; Algorithm design and analysis; Automatic test pattern generation; Automatic testing; Benchmark testing; Circuit faults; Circuit synthesis; Circuit testing; Libraries; Logic testing; Prototypes;
Journal_Title :
Design & Test of Computers, IEEE
