Title :
First results of ITC´99 benchmark circuits
Author_Institution :
Analog Devices Inc., Austin, TX, USA
Abstract :
The ISCAS circuits have long been used as design-for-testability benchmarks; however, recent progress in technology requires newer DFT standards. This look at the ITC´99 benchmarks reveals complexities that will serve as a starting point for other researchers
Keywords :
logic testing; performance evaluation; ISCAS circuits; ITC´99 benchmark circuits; ITC´99 benchmarks; design-for-testability; Application specific integrated circuits; Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Design automation; Design methodology; Hardware design languages; Logic;
Journal_Title :
Design & Test of Computers, IEEE
