• DocumentCode
    1379459
  • Title

    Digital-compatible BIST for analog circuits using transient response sampling

  • Author

    Variyam, Pramodchandran N. ; Chatterjee, Abhijit

  • Author_Institution
    Mkixed-Signal Wireless Group, Texas Instrum. Inc., Dallas, TX, USA
  • Volume
    17
  • Issue
    3
  • fYear
    2000
  • Firstpage
    106
  • Lastpage
    115
  • Abstract
    For complex mixed-signal designs, BIST is becoming a necessity. The BIST scheme presented here maximizes coverage of parametric and catastrophic failures and provides an all-digital BIST solution to analog circuits
  • Keywords
    analogue circuits; built-in self test; BIST; analog circuits; mixed-signal designs; transient response sampling; Analog circuits; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault diagnosis; Production; Sampling methods; Space vector pulse width modulation; Transient response;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.867901
  • Filename
    867901
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1379459