Title :
Architecture and reliability of fault tolerant bitonic sorter
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst.
fDate :
2/19/1998 12:00:00 AM
Abstract :
Bitonic sorters are used in a number of telecommunication switching and digital signal processing systems, where any fault in the sorters may spell disaster. Unlike the conventional approach to enhance reliability using redundant sorters, the author presents a sorter with internal redundant sorting elements and evaluates its fault tolerance
Keywords :
VLSI; failure analysis; integrated circuit reliability; redundancy; reliability theory; signal processing; sorting; telecommunication switching; DSP systems; digital signal processing systems; fault tolerance evaluation; fault tolerant bitonic sorter; internal redundant sorting elements; reliability; telecommunication switching;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19980253
