Title :
A reliability testing environment for off-the-shelf memory subsystems
Author :
Hwang, Seung H. ; Choi, Gwan S.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
A cyclotron-based radiation test environment enables engineers to characterize the soft-error sensitivity of memory subsystems and assess its impact at the system level. Device/circuit modeling and simulation assist the radiation experiments in detecting device-level single-event upsets
Keywords :
digital storage; reliability; testing; device-level; off-the-shelf memory subsystems; radiation test environment; reliability testing; single-event upsets; soft-error sensitivity; Analytical models; Circuit faults; Circuit simulation; Circuit testing; Cyclotrons; Error correction codes; Radiation effects; Random access memory; Single event upset; System testing;
Journal_Title :
Design & Test of Computers, IEEE
