DocumentCode :
1379757
Title :
Light-Weight On-Chip Monitoring Network for Dynamic Adaptation and Calibration
Author :
Ituero, Pablo ; López-Vallejo, Marisa ; Marcos, Miguel Ángel Sánchez ; Osuna, Carlos Gómez
Author_Institution :
Dept. of Electron. Eng., Univ. Politec. de Madrid, Madrid, Spain
Volume :
12
Issue :
6
fYear :
2012
fDate :
6/1/2012 12:00:00 AM
Firstpage :
1736
Lastpage :
1745
Abstract :
Current nanometer technologies suffer within-die parameter uncertainties, varying workload conditions, aging, and temperature effects that cause a serious reduction on yield and performance. In this scenario, monitoring, calibration, and dynamic adaptation become essential, demanding systems with a collection of multi purpose monitors and exposing the need for light-weight monitoring networks. This paper presents a new monitoring network paradigm able to perform an early prioritization of the information. This is achieved by the introduction of a new hierarchy level, the threshing level. Targeting it, we propose a time-domain signaling scheme over a single-wire that minimizes the network switching activity as well as the routing requirements. To validate our approach, we make a thorough analysis of the architectural trade-offs and expose two complete monitoring systems that suppose an area improvement of 40% and a power reduction of three orders of magnitude compared to previous works.
Keywords :
CMOS integrated circuits; ageing; calibration; integrated circuit reliability; integrated circuit yield; nanotechnology; network routing; time-domain analysis; aging; architectural trade-offs; calibration; dynamic adaptation; early prioritization; hierarchy level; light-weight monitoring networks; light-weight on-chip monitoring network; monitoring network paradigm; multipurpose monitors; nanometer technology; network switching activity; performance reduction; power reduction; routing requirements; temperature effects; thorough analysis; threshing level; time-domain signaling scheme; varying workload conditions; within-die parameter uncertainty; yield reduction; Calibration; Monitoring; Radiation detectors; Synchronization; Temperature measurement; Temperature sensors; Aging; complementary metal oxide semiconductor; dynamic adaptation; leakage; monitoring; on-chip; temperature;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2011.2176485
Filename :
6084809
Link To Document :
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