DocumentCode :
1379764
Title :
A Fully-Integrated 3-Level DC-DC Converter for Nanosecond-Scale DVFS
Author :
Kim, Wonyoung ; Brooks, David ; Wei, Gu-Yeon
Author_Institution :
Harvard Univ., Cambridge, MA, USA
Volume :
47
Issue :
1
fYear :
2012
Firstpage :
206
Lastpage :
219
Abstract :
On-chip DC-DC converters have the potential to offer fine-grain power management in modern chip-multiprocessors. This paper presents a fully integrated 3-level DC-DC converter, a hybrid of buck and switched-capacitor converters, implemented in 130 nm CMOS technology. The 3-level converter enables smaller inductors (1 nH) than a buck, while generating a wide range of output voltages compared to a 1/2 mode switched-capacitor converter. The test-chip prototype delivers up to 0.85 A load current while generating output voltages from 0.4 to 1.4 V from a 2.4 V input supply. It achieves 77% peak efficiency at power density of 0.1 W/mm2 and 63% efficiency at maximum power density of 0.3 W/mm2. The converter scales output voltage from 0.4 V to 1.4 V (or vice-versa) within 20 ns at a constant 450 mA load current. A shunt regulator reduces peak-to-peak voltage noise from 0.27 V to 0.19 V under pseudo-randomly fluctuating load currents. Using simulations across a wide range of design parameters, the paper compares conversion efficiencies of the 3-level, buck and switched-capacitor converters.
Keywords :
CMOS integrated circuits; DC-DC power convertors; inductors; microprocessor chips; power aware computing; CMOS technology; buck converters; chip-multiprocessors; current 450 mA; dynamic voltage scaling; fine-grain power management; frequency scaling; fully-integrated 3-level DC-DC converter; inductors; nanosecond-scale DVFS; on-chip DC-DC converters; shunt regulator; size 130 nm; switched-capacitor converters; Converters; DC-DC power converters; Dynamic voltage scaling; FETs; Switching frequency; System-on-a-chip; Voltage control; 3-level; DC-DC conversion; dynamic voltage and frequency scaling; fully integrated converter; switching converter;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2011.2169309
Filename :
6084810
Link To Document :
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