DocumentCode
1379796
Title
Salvaging test windows in BIST diagnostics
Author
Savir, Jacob
Author_Institution
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
Volume
47
Issue
4
fYear
1998
fDate
4/1/1998 12:00:00 AM
Firstpage
486
Lastpage
491
Abstract
This paper uses the STUMPS architecture to study the properties of a new diagnostic procedure. According to the old procedure, the process stops at the end of each test window to compare the measured signature against its precomputed value. The old procedure also calls for the abandonment of all future test windows after the first failing one is encountered. This is due to the unavailability of expected future test window signatures in the presence of a previously captured error. This paper shows a simple method of salvaging future test windows by adjusting their expected signatures to fit past observed errors. Experiments conducted using this new procedure reveal an improvement of at least one order of magnitude in diagnostic resolution over what has been previously experienced
Keywords
built-in self test; logic testing; BIST diagnostics; STUMPS architecture; diagnostic procedure; logic testing; test window; Built-in self-test; Clocks; Design methodology; Error analysis; Failure analysis; Jacobian matrices; Logic testing; Multichip modules; Remotely operated vehicles; Sequential analysis;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.675718
Filename
675718
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