• DocumentCode
    1380670
  • Title

    A finite element method for the determination of space charge distributions in complex geometry

  • Author

    Paris, O. ; Lewiner, J. ; Ditchi, T. ; Holé, S. ; Alquié, C.

  • Author_Institution
    Lab. d´´Electricite Gen., Ecole Superieure de Phys. et de Chimie Ind., Paris, France
  • Volume
    7
  • Issue
    4
  • fYear
    2000
  • fDate
    8/1/2000 12:00:00 AM
  • Firstpage
    556
  • Lastpage
    560
  • Abstract
    Electrical breakdown in insulators very often initiate near high field regions of the structure, as found near small-radius impurities or at electrode defects. This is attributed to the development of localized space charges. For this reason many efforts have been made to determine such charge. Various techniques are now available, but they are not directly applicable to complex geometries where it is difficult to determine analytically the field configuration and thus the relation between the measured variables and the space charge distribution. To solve this problem, we propose to use a numerical simulation using a finite element method (FEM). In this paper we describe how it can be implemented in the case of the pressure wave propagation (PWP) method. It is shown that measured signals in insulating samples with divergent electric field regions are well fitted by simulations. We show that this allows for the determination of space charge distribution in such samples
  • Keywords
    electric breakdown; finite element analysis; insulating materials; space charge; complex geometry; divergent electric field; electrical breakdown; electrode defect; finite element method; impurity; insulating material; numerical simulation; pressure wave propagation; space charge distribution; Charge measurement; Current measurement; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Finite element methods; Geometry; Impurities; Numerical simulation; Space charge;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.868077
  • Filename
    868077