DocumentCode :
138089
Title :
Comparison of bondwire life with effective strain method and cohesive zone method for a power package
Author :
Jicheng Zhang ; Yangjian Xu ; Yong Liu
Author_Institution :
Fairchild -ZJUT Microelectron. Packaging Joint Lab., Zhejiang Univ. of Technol., Hangzhou, China
fYear :
2014
fDate :
7-9 April 2014
Firstpage :
1
Lastpage :
7
Abstract :
In this paper, the cohesive zone model was used to simulate the stiffness degradation of interfaces between dies and solder joints in a power module. Subsequently, the fatigue life of the solder joints was predicted by the effective strain method. In addition, the cohesive zone model, collabrating with a modified paris´ law, was further utilized to investigate the reliability of a wirebond model. At the same time, the effect of the cohesive zone model parameters on the reliability was studied.
Keywords :
electronics packaging; lead bonding; modules; reliability; solders; bondwire life; cohesive zone method; dies; effective strain method; modified Paris law; power module; power package; reliability; solder joints; stiffness degradation; wire bond model; Abstracts; Ceramics; Copper; Electromagnetic compatibility; Equations; Reliability; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2014 15th international conference on
Conference_Location :
Ghent
Print_ISBN :
978-1-4799-4791-1
Type :
conf
DOI :
10.1109/EuroSimE.2014.6813798
Filename :
6813798
Link To Document :
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