• DocumentCode
    1380926
  • Title

    Exposure Time Dependence of Dark Current in CCD Imagers

  • Author

    Widenhorn, Ralf ; Dunlap, Justin C. ; Bodegom, Erik

  • Author_Institution
    Portland State Univ., Portland, OR, USA
  • Volume
    57
  • Issue
    3
  • fYear
    2010
  • fDate
    3/1/2010 12:00:00 AM
  • Firstpage
    581
  • Lastpage
    587
  • Abstract
    In this paper, we present a systematic study on the rate of dark current generation of two scientific charge-coupled device imagers. The dark current in both imagers was measured for exposure times from 5 to 7200 s at a constant temperature. As one would expect, the majority of pixels show a linear increase in dark count with exposure time. However, we found distinct groups of pixels that show a nonlinear dark current dependence versus exposure time well below saturation. Since the dark count is often assumed to scale linearly with exposure time, these pixels can pose a problem during dark current correction. We also discuss what could cause some pixels to produce a dark count that is linear versus exposure time whereas others do not.
  • Keywords
    CCD image sensors; CCD imagers; charge-coupled device imagers; dark current generation; Charge coupled devices; Current measurement; Dark current; Digital images; Heart; Impurities; Photonic band gap; Signal to noise ratio; Silicon; Temperature dependence; Charge-coupled devices (CCDs); dark current; exposure time nonlinearity; impurities;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2009.2038649
  • Filename
    5378633