Title :
Second harmonic generation of thin LiNbO3 samples for acoustic wave devices
Author :
Rams, J. ; Townsend, P.D. ; Pannell, C.
Author_Institution :
Univ. Rey Juan Carlos I, Madrid, Spain
fDate :
8/31/2000 12:00:00 AM
Abstract :
The response or thin LiNbO3 samples bonded on substrates for acousto-optic devices operating above a few hundred MHz is often greatly reduced relative to that of bulk material. The technique reported here is for the measurement of the second harmonic generation performance in the outer 75 nm of the sample. This is a sensitive monitor of the perfection of the crystalline lattice and reveals damage from sample preparation
Keywords :
acousto-optical devices; bulk acoustic wave devices; lithium compounds; nondestructive testing; optical harmonic generation; LiNbO3; NDT; SHG performance measurement; acoustic wave devices; acousto-optic devices; crystalline lattice; materials testing; sample preparation damage; second harmonic generation; sensitive monitor; surface optical SHG; thin LiNbO3 samples;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20001099
