DocumentCode :
138118
Title :
Thermo-mechanical simulation of plastic deformation during temperature cycling of bond wires for power electronic modules
Author :
Wright, Andrew ; Hutzler, Aaron ; Schletz, A. ; Pichler, Peter
Author_Institution :
Fraunhofer Inst. for Integrated Syst. & Device Technol. (IISB), Erlangen, Germany
fYear :
2014
fDate :
7-9 April 2014
Firstpage :
1
Lastpage :
5
Abstract :
Modelling was undertaken to investigate the role of bond wire size on reliability in power electronic converters. Experiments have shown that thin 125 μm Al wires used in place of 375 μm Al wires alleviate bond wire lift-off and further outlast other sources of failure such as solder degradation in a power module. To investigate the role of bond-wire size on wire lift-off, the effective plastic strain was estimated through thermo-mechanical simulation. Three-dimensional models were constructed for the thin and thick bond wires, respectively. For the critical deformation of the aluminium bond wires during thermal cycling, a temperature-dependent bi-linear plasticity model was used. The effect of a difference in yield strength for the thin wires was also investigated. Maximum as well as volumetrically averaged values of the effective plastic strain showed significant differences between the thick and thin wires and wires with different yield strengths. The modelling results show higher effective plastic strain for the thick wires - supporting the experimental findings.
Keywords :
aluminium alloys; circuit reliability; plastic deformation; power convertors; wires (electric); yield strength; Al; aluminium bond wires; bond wire lift-off; bond wire size; plastic deformation; plastic strain; power electronic converters; power electronic modules; reliability; size 125 mum; size 375 mum; solder degradation; temperature cycling; temperature-dependent bi-linear plasticity model; thermo-mechanical simulation; three-dimensional models; yield strength; Abstracts; Artificial intelligence; Copper; Europe; Reliability; Silicon; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2014 15th international conference on
Conference_Location :
Ghent
Print_ISBN :
978-1-4799-4791-1
Type :
conf
DOI :
10.1109/EuroSimE.2014.6813813
Filename :
6813813
Link To Document :
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