• DocumentCode
    138123
  • Title

    Mutiphysics study of RF/microwave planar devices: Effect of the input signal power

  • Author

    Sanchez-Soriano, Miguel A. ; Edwards, Michael ; Quere, Yves ; Andersson, Dag ; Cadiou, S. ; Quendo, C.

  • Author_Institution
    Lab.-STICC, Univ. de Bretagne Occidentale, Brest, France
  • fYear
    2014
  • fDate
    7-9 April 2014
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In this paper, the effects of the input signal power on microwave planar devices are studied in detail. In this context, a complete multiphysics study is performed, involving the electro-thermo-mechanical coupling in microwave components. For this study, a multiphysics simulator is used. As shown, for moderate input powers, the device transfer function can be altered, mainly in terms of an increase of losses and a frequency shift. Additionally, hot spots are to be appeared, whose location is related to the electromagnetic field distribution of the passive device under test. Guidelines are also provided to estimate the average power handling capability (APHC) of planar components. As an example, the multiphysics analysis of a microstrip coupled-line filter centered at 42 GHz is tackled taken into account different thermal and mechanical boundary conditions.
  • Keywords
    coupled circuits; microstrip filters; microstrip lines; microwave circuits; microwave filters; transfer functions; APRC; RF-microwave planar device; average power handling capability; electromagnetic field distribution; electrothermomechanical coupling; frequency 42 GHz; input signal power effect; mechanical boundary condition; microstrip coupled-line filter; mutiphysics study; passive device under test; thermal boundary condition; transfer function; Abstracts; Dielectric losses; Electromagnetics; Radio frequency; Stress; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2014 15th international conference on
  • Conference_Location
    Ghent
  • Print_ISBN
    978-1-4799-4791-1
  • Type

    conf

  • DOI
    10.1109/EuroSimE.2014.6813816
  • Filename
    6813816