DocumentCode
1381368
Title
Nonvolatile SRAM cell using different capacitance loading
Author
Hur, Sung-Hoi ; Han, Chul-Hi
Author_Institution
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
Volume
34
Issue
3
fYear
1998
fDate
2/5/1998 12:00:00 AM
Firstpage
251
Lastpage
253
Abstract
A simple and novel nonvolatile SRAM (NVSRAM) cell is proposed. NVSRAM cell can be achieved by adding only one nonvolatile device with split floating gates to a conventional SRAM cell. It acts as a conventional SRAM cell under normal operation. SRAM cell data are programmed to the nonvolatile device by hot electron injection. At power up, data are restored using different capacitance loading resulting from the split floating gate. The operations have been confirmed by circuit simulation. The NVSRAM cell is symmetric, and therefore has better retention characteristics than other NVSRAM cells
Keywords
SRAM chips; capacitance; hot carriers; capacitance loading; circuit simulation; hot electron injection; nonvolatile SRAM cell; split floating gate device;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19980234
Filename
677342
Link To Document