• DocumentCode
    1381368
  • Title

    Nonvolatile SRAM cell using different capacitance loading

  • Author

    Hur, Sung-Hoi ; Han, Chul-Hi

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
  • Volume
    34
  • Issue
    3
  • fYear
    1998
  • fDate
    2/5/1998 12:00:00 AM
  • Firstpage
    251
  • Lastpage
    253
  • Abstract
    A simple and novel nonvolatile SRAM (NVSRAM) cell is proposed. NVSRAM cell can be achieved by adding only one nonvolatile device with split floating gates to a conventional SRAM cell. It acts as a conventional SRAM cell under normal operation. SRAM cell data are programmed to the nonvolatile device by hot electron injection. At power up, data are restored using different capacitance loading resulting from the split floating gate. The operations have been confirmed by circuit simulation. The NVSRAM cell is symmetric, and therefore has better retention characteristics than other NVSRAM cells
  • Keywords
    SRAM chips; capacitance; hot carriers; capacitance loading; circuit simulation; hot electron injection; nonvolatile SRAM cell; split floating gate device;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19980234
  • Filename
    677342