Characterization of Nonlinear Optical Crosstalk in Silicon Nanowaveguides

Author

Okawachi, Yoshitomo ; Kuzucu, Onur ; Foster, Mark A. ; Salem, Reza ; Turner-Foster, Amy C. ; Biberman, Aleksandr ; Ophir, Noam ; Bergman, Keren ; Lipson, Michal ; Gaeta, Alexander L.

Author_Institution

Sch. of Appl. & Eng. Phys., Cornell Univ., Ithaca, NY, USA

Volume

24

Issue

3

fYear

2012

Firstpage

185

Lastpage

187

Abstract

We investigate optical crosstalk on a signal in a silicon nanowaveguide due to the presence of another signal by direct radio frequency crosstalk level measurements in a pump-probe configuration and by bit-error-rate-based characterization. We quantify this degradation as a function of the modulation frequency and power of the auxiliary signal. Our results indicate that two-photon and free-carrier absorption are primary facilitators of crosstalk in silicon nanowaveguides.

Keywords

elemental semiconductors; error statistics; nanophotonics; optical crosstalk; optical modulation; optical pumping; optical waveguides; photoexcitation; silicon; two-photon processes; Si; auxiliary signal; bit-error-rate-based characterization; direct radiofrequency crosstalk level measurements; free-carrier absorption; modulation frequency; nonlinear optical crosstalk; pump-probe configuration; silicon nanowaveguides; two-photon absorption; Bit error rate; Crosstalk; Frequency modulation; Optical crosstalk; Photonics; Silicon; Nanophotonics; nanowaveguides; nonlinear optical devices; nonlinear optics; optical crosstalk; optical signal processing;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2011.2177080

Filename

6086567