Title :
Design and Modelling of Miniaturized Bandgap Structure for Wideband GHz-Noise Suppression Based on LTCC Technology
Author :
Huang, Yu-Wen ; Wang, Ting-Kuang ; Wu, Tzong-Lin
Author_Institution :
Dept. of Electr. of Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
A novel electromagnetic bandgap (EBG) structure is proposed for broadband suppression of gigahertz simultaneous switching noise. The structure is composed of three-dimensional interdigital capacitors (3D-IDC) and series U-shaped transmission lines periodically. The EBG structure can be miniaturized based on the LTCC fabrication technology. A theoretical circuit model which considers the inductive coupling in the 3D-IDC will be developed to predict the stopband. The accuracy of the proposed model will be verified by comparing with both the full-wave simulation and the measurement results. This modeling method is also employed to study the variation of bandgap dependent on different geometrical parameters for the 3D-IDC and the U-shaped transmission line. A prototype is implemented using the LTCC technology with the dimension 1.2 mm × 3.8 mm × 0.728 mm. Both simulation and measurement show the rejection band is from 2 to 5.5 GHz. Over 45 dB noise reduction in the stop band could be achieved. In addition, the suppressive ability is also verified in the chip-package co-simulation. From the simulation result, significant reduction of power noise could be found both in digital and mixed signal circuits.
Keywords :
ceramic packaging; circuit noise; electromagnetic interference; photonic band gap; transmission lines; 3D interdigital capacitors; LTCC fabrication technology; U-shaped transmission lines; chip-package co-simulation; electromagnetic bandgap; frequency 2 GHz to 5.5 GHz; full-wave simulation; gigahertz simultaneous switching noise; inductive coupling; miniaturized bandgap structure; noise reduction; wideband noise suppression; Electromagnetic bandgap (EBG); low temperature co-fire ceramic (LTCC); three-dimension interdigital capacitors (3D-IDC);
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2009.2036857