DocumentCode :
138188
Title :
MedeA®: Atomistic simulations for designing and testing materials for micro/nano electronics systems
Author :
France-Lanord, A. ; Rigby, D. ; Mavromaras, A. ; Eyert, V. ; Saxe, P. ; Freeman, Chas ; Wimmer, E.
Author_Institution :
Mater. Design SARL, Montrouge, France
fYear :
2014
fDate :
7-9 April 2014
Firstpage :
1
Lastpage :
8
Abstract :
Results of atomic-scale simulations are presented including thermal conductivity, elastic moduli, diffusion, and adhesion. This type of simulations is most conveniently performed with the MedeA® computational environment, which comprises experimental structure databases together with building tools to construct models of complex solids, surfaces, and interfaces for both crystalline and amorphous systems. Central to MedeA® are state-of-the-art modules for the automated calculation of thermodynamic, structural, electronic, mechanical, vibrational, and transport properties combined with the corresponding graphical analysis and visualization tools. These capabilities are illustrated for both inorganic and organic materials. For Si-Ge alloys and amorphous-crystalline silicon superlattices we find a drastic reduction of the thermal conductivity compared with bulk crystalline Si. In addition, the Si-Ge alloys reveal a considerable sensitivity of their thermal conductivity to disorder. The second part of this study addresses properties of epoxy resin based thermosets, including their mechanical stiffness, thermal conductivity, and adhesion on alumina. In addition, we present calculated results for oxygen and water diffusivities in cross-linked epoxy systems and discuss factors influencing such diffusivities as, e.g., mass effects or the concentration of residual hydroxyl groups in the polymer.
Keywords :
Ge-Si alloys; adhesion; elastic moduli; elemental semiconductors; integrated circuits; materials testing; nanoelectronics; resins; semiconductor superlattices; silicon; thermal conductivity; MedeA; Si; Si-Ge; adhesion; amorphous systems; amorphous-crystalline silicon superlattices; atomic-scale simulations; cross-linked epoxy systems; crystalline systems; diffusion; elastic moduli; electronic properties; epoxy resin based thermosets; experimental structure databases; graphical analysis; inorganic materials; mass effects; material testing; mechanical properties; mechanical stiffness; microelectronics systems; nanoelectronics systems; organic materials; polymer; residual hydroxyl group concentration; structural properties; thermal conductivity; thermodynamic properties; transport properties; vibrational properties; visualization tools; water diffusivity; Abstracts; Computational modeling; Lead; Reliability; Resins;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2014 15th international conference on
Conference_Location :
Ghent
Print_ISBN :
978-1-4799-4791-1
Type :
conf
DOI :
10.1109/EuroSimE.2014.6813850
Filename :
6813850
Link To Document :
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