Title :
Compact range reflector analysis using the plane wave spectrum approach with an adjustable sampling rate
Author :
McKay, James P. ; Rahmat-Sam, Yahya
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
fDate :
6/1/1991 12:00:00 AM
Abstract :
An improved method for determining the test zone field of compact range reflectors is presented. The plane wave spectrum (PWS) approach is used to obtain the test zone field from knowledge of the reflector aperture field distribution. The method is particularly well suited to the analysis of reflectors with a linearly serrated rim for reduced edge diffraction. Computation of the PWS of the reflector aperture field is facilitated by a closed-form expression for the Fourier transform of a polygonal window function. Inverse transformation in the test zone region is accomplished using a fast Fourier transform (FFT) algorithm with a properly adjusted sampling rate (which is a function of both the reflector size and the distance from the reflector). The method is validated by comparison with results obtained using surface current and aperture field integration techniques. The performance of several serrated reflectors is evaluated in order to observe the effects of edge diffraction on the test zone fields
Keywords :
antenna radiation patterns; antenna reflectors; electromagnetic wave diffraction; electronic equipment testing; numerical analysis; FFT; adjustable sampling rate; antenna radiation patterns; antenna reflectors; aperture field integration; closed-form expression; compact range reflectors; edge diffraction; fast Fourier transform; numerical analysis; plane wave spectrum approach; polygonal window function; reflector aperture field distribution; serrated reflectors; serrated rim; surface current; test zone field; Antenna measurements; Apertures; Closed-form solution; Fast Fourier transforms; Lighting; Magnetic field measurement; Physical theory of diffraction; Sampling methods; Student members; Testing;
Journal_Title :
Antennas and Propagation, IEEE Transactions on