Title :
Monitoring and Tuning Micro-Ring Properties Using Defect-Enhanced Silicon Photodiodes at 1550 nm
Author :
Logan, Dylan F. ; Velha, Philippe ; Sorel, Marc ; De La Rue, Richard M. ; Jessop, Paul E. ; Knights, Andrew P.
Author_Institution :
Dept. of Eng. Phys., McMaster Univ., Hamilton, ON, Canada
Abstract :
We report on the application of defect-enhanced silicon waveguide photodiodes operating at 1550 nm as power monitors for use in photonic integrated circuits. In-line monitors of 250-μm length provide an efficiency of 97 mA/W by absorbing only 8% of the optical mode. The monitors were integrated onto micro-ring waveguide ports to provide measures of optical resonance characteristics and a feedback to a thermal resonance tuner. The suitability of these photodetectors for control of micro-ring resonators is demonstrated.
Keywords :
integrated optics; micro-optics; optical waveguides; photodiodes; defect enhanced silicon photodiodes; microring properties; microring resonators; microring waveguide; monitoring and tuning; optical mode; optical resonance characteristics; photonic integrated circuits; thermal resonance tuner; wavelength 1550 nm; Monitoring; Optical feedback; Optical resonators; Optical waveguides; Silicon; Temperature measurement; Temperature sensors; Optical interconnections; optical waveguide components; optoelectronic devices; p-i-n photodiodes; semiconductor defects; semiconductor waveguides;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2011.2177453
