DocumentCode :
138238
Title :
Finite element multi-physics modeling for ohmic contact of microswitches
Author :
Liu, Hongying ; Leray, D. ; Pons, P. ; Colin, S.
Author_Institution :
Inst. Clement Ader, Univ. de Toulouse, Toulouse, France
fYear :
2014
fDate :
7-9 April 2014
Firstpage :
1
Lastpage :
8
Abstract :
The purpose of this paper is to investigate the thermoelectrical behaviour of ohmic microcontacts under low force. The temperature in the contact zone is very important for the reliability of microswitches. As it is very difficult to measure the inner temperature, the numerical thermal modelling of electrical contacts offers interesting perspectives. A multi-physics modelling of electrical contact is accomplished with the finite element commercial package ANSYS™. Two approaches for coupled-field analysis are investigated, namely direct and load transfer. The thermo-electro-mechanical modelling is firstly validated with a smooth sphere-plane contact, and then applied for a real rough contact computation, elastic-plastic material deformation is included in the modelling. The temperature distribution on the contact surface is plotted, and the maximum temperature is found around the asperities with the highest deformation. The multi-physics model offers a reliable method to investigate the steady-state thermal behaviour of electrical contact with rough surface included.
Keywords :
elastic deformation; finite element analysis; microswitches; ohmic contacts; plastic deformation; temperature distribution; ANSYS; contact surface; contact zone; coupled-field analysis; direct transfer; elastic-plastic material deformation; electrical contacts; finite element commercial package; load transfer; microswitches reliability; multiphysics modelling; numerical thermal modelling; ohmic microcontacts; rough contact computation; smooth sphere-plane contact; temperature distribution; thermoelectrical behaviour; thermoelectromechanical modelling; Contacts; Finite element analysis; Load modeling; Mathematical model; Resistance; Rough surfaces; Surface roughness; finite element modelling; microswitches; multi-physics; ohmic contact;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2014 15th international conference on
Conference_Location :
Ghent
Print_ISBN :
978-1-4799-4791-1
Type :
conf
DOI :
10.1109/EuroSimE.2014.6813877
Filename :
6813877
Link To Document :
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