DocumentCode :
1382380
Title :
A High-Performance Procedure for Effective Number of Bits Estimation in Analog-to-Digital Converters
Author :
Belega, Daniel ; Dallet, Dominique ; Petri, Dario
Author_Institution :
Fac. of Electron. & Telecommun., Politeh. Univ. of Timisoara, Timişoara, Romania
Volume :
60
Issue :
5
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
1522
Lastpage :
1532
Abstract :
This paper deals with a procedure for high-accuracy fast estimation of the effective number of bits ( ENOB) of an analog-to-digital converter (ADC). According to this procedure the ADC output sine-wave parameters are determined through the interpolated discrete Fourier transform (IpDFT) method. One criterion for the selection of the window that will be used in the IpDFT method is provided. In addition, mathematical expressions for the accuracy of both the sine-fitting procedure based on the IpDFT method and the proposed ENOB estimation method are derived, and a lower bound on the number of acquired samples that ensures accurate ENOB estimates with a high confidence level is proposed. In particular, it is proved that the uncertainty of the proposed ENOB estimation procedure is almost the same as the theoretical lower bound for the variance of any unbiased ENOB estimator. Finally, the accuracy of the proposed procedure and the algorithms suggested in the existing standards for ADCs testing are compared through both computer simulations and experimental results. In addition, the processing times required by each considered method are compared, therefore proving the advantage of the proposed procedure in terms of the required computational burden.
Keywords :
analogue-digital conversion; discrete Fourier transforms; ENOB estimation method; IpDFT; analog to digital converter; bit estimation; effective number of bit; interpolated discrete Fourier transform method; Accuracy; Discrete Fourier transforms; Estimation; Noise; Testing; Time domain analysis; Uncertainty; Effective number of bits (ENOB) estimation; interpolated discrete Fourier transform (IpDFT) method; maximum side-lobe decay windows; noncoherent sampling; sine-fitting algorithms; uncertainty analysis;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2010.2089151
Filename :
5639081
Link To Document :
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