Title :
System reliability for LED-based products
Author :
Davis, J. Lynn ; Mills, K. ; Lamvik, Mike ; Yaga, Robert ; Shepherd, Sarah D. ; Bittle, James ; Baldasaro, Nick ; Solano, E. ; Bobashev, Georgiy ; Johnson, Chris ; Evans, Adrian
Author_Institution :
RTI Int., Research Triangle Park, NC, USA
Abstract :
Results from accelerated life tests (ALT) on mass-produced commercially available 6" downlights are reported along with results from commercial LEDs. The luminaires capture many of the design features found in modern luminaires. In general, a systems perspective is required to understand the reliability of these devices since LED failure is rare. In contrast, components such as drivers, lenses, and reflector are more likely to impact luminaire reliability than LEDs.
Keywords :
life testing; light emitting diodes; reliability; LED-based products; accelerated life tests; drivers; lenses; reflector; system reliability; Abstracts; Light emitting diodes;
Conference_Titel :
Thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2014 15th international conference on
Conference_Location :
Ghent
Print_ISBN :
978-1-4799-4791-1
DOI :
10.1109/EuroSimE.2014.6813879
