DocumentCode
138241
Title
System reliability for LED-based products
Author
Davis, J. Lynn ; Mills, K. ; Lamvik, Mike ; Yaga, Robert ; Shepherd, Sarah D. ; Bittle, James ; Baldasaro, Nick ; Solano, E. ; Bobashev, Georgiy ; Johnson, Chris ; Evans, Adrian
Author_Institution
RTI Int., Research Triangle Park, NC, USA
fYear
2014
fDate
7-9 April 2014
Firstpage
1
Lastpage
7
Abstract
Results from accelerated life tests (ALT) on mass-produced commercially available 6" downlights are reported along with results from commercial LEDs. The luminaires capture many of the design features found in modern luminaires. In general, a systems perspective is required to understand the reliability of these devices since LED failure is rare. In contrast, components such as drivers, lenses, and reflector are more likely to impact luminaire reliability than LEDs.
Keywords
life testing; light emitting diodes; reliability; LED-based products; accelerated life tests; drivers; lenses; reflector; system reliability; Abstracts; Light emitting diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2014 15th international conference on
Conference_Location
Ghent
Print_ISBN
978-1-4799-4791-1
Type
conf
DOI
10.1109/EuroSimE.2014.6813879
Filename
6813879
Link To Document