Title :
Single-Event Upsets in Photoreceivers for Multi-Gb/s SLHC Data Transmission
Author :
El Nasr-Storey, Sarah Seif ; Detraz, Stephane ; Gui, Ping ; Menouni, Mohsine ; Moreira, Paulo ; Papadopoulos, Spyridon ; Sigaud, Christophe ; Soos, Csaba ; Stejskal, Pavel ; Troska, Jan ; Vasey, Francois
Author_Institution :
CERN, Geneva, Switzerland
Abstract :
A 63 MeV proton beam was used to perform a single event upset (SEU) test on a candidate component for a future high luminosity large hadron collider (HL-LHC) high speed optical. An in-lab error injector was used to show that 1-0 bit errors are caused by the amplifier´s response to the large signal caused by a single event transient (SET) in the photodiode.
Keywords :
data communication equipment; nuclear electronics; optical communication equipment; particle detectors; photodetectors; photodiodes; HL-LHC; Large Hadron Collider; SET; SEU test; high luminosity LHC high speed optical data communication; in lab error injector; multi-Gb/s SLHC data transmission; photodiode; photoreceivers; single event transient; single event upsets; Histograms; Large Hadron Collider; Optical fiber communication; Particle beams; Photodiodes; Receivers; Single event upset; High speed optical links; LHC; single event upsets;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2172632
