DocumentCode :
1382588
Title :
Quality Factor Analysis for Cross-Coupled 
Oscillators Using a Time-Varying Root Locus
Author :
Broussev, Svetozar S. ; Tchamov, Nikolay T.
Author_Institution :
Dept. of Commun. Eng., Tampere Univ. of Technol., Tampere, Finland
Volume :
59
Issue :
1
fYear :
2012
Firstpage :
25
Lastpage :
29
Abstract :
An extraction of an effective oscillator Q factor in cross-coupled LC oscillators using time-varying root locus is proposed. The extraction utilizes root computations and analytical expression of the cross-coupled-pair admittance. The methodology permits to investigate the Q-factor degradation mechanisms in large-signal LC oscillators and to compare different oscillator topologies. The obtained effective Q factor is validated through SpectreRF simulations and phase noise measurements of a voltage-controlled oscillator fabricated on a 130-nm process.
Keywords :
Q-factor; voltage-controlled oscillators; Q-factor degradation; cross-coupled LC oscillators; cross-coupled-pair admittance; oscillator Q factor; quality factor analysis; time-varying root locus; voltage-controlled oscillator; Admittance; Phase measurement; Phase noise; Q factor; Voltage-controlled oscillators; Oscillator; Q factor; time-varying root locus (TVRL);
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2011.2174673
Filename :
6086754
Link To Document :
