Title :
Nuclear protective system design for reliability
Author :
Cockrell, J.L. ; Magee, J.H. ; Underkoffler, V.S.
Author_Institution :
University of Michigan, Madison, Mich.
fDate :
7/1/1963 12:00:00 AM
Abstract :
The reliability of redundant configurations of majority logic switching circuits is mathematically developed using the system state probability method. Both repairable and nonrepayable systems are considered. A compatible set of solid-state switching circuits is described which satisfies the requirements of the mathematical models. The nuclear protective system problem is considered in detail since it is a typical application whereby long-term high reliability is a major requirement.
Journal_Title :
American Institute of Electrical Engineers, Part I: Communication and Electronics, Transactions of the
DOI :
10.1109/TCE.1963.6373324
