Title :
High-throughput analysis of the morphology and mechanics of tip growing cells using a microrobotic platform
Author :
Felekis, Dimitrios ; Vogler, Hannes ; Mecja, Geraldo ; Muntwyler, Simon ; Sakar, Mahmut Selman ; Grossniklaus, Ueli ; Nelson, Bradley J.
Author_Institution :
Inst. of Robot. & Intell. Syst., ETH Zurich, Zurich, Switzerland
Abstract :
We present a microrobotic platform that combines MEMS-based capacitive force sensing technology, a dual-stage positioning system and a real-time control and acquisition architecture with computer vision automation to manipulate and mechanically characterize growing plant cells. The topography accuracy of the system, using a silicon wafer sample is measured to be 28 nm(1σ, 200Hz). With an SI-traceable stiffness reference we estimate the accuracy of the RT-CFM to be 3.49%. The target locations are selected from an interactive image of the workspace, and the sensing tip is positioned at each location using visual servoing techniques. Topography and stiffness maps were successfully obtained on growing pollen tubes. With the proposed system, cells can be mechanically stimulated at high speeds and with high precision while the intracellular components are visualized using confocal imaging. The system offers a versatile solution for dexterous and high-throughput characterization of biological specimen.
Keywords :
biological techniques; biology computing; biomechanics; capacitive sensors; cellular biophysics; computer vision; force sensors; microrobots; microsensors; surface topography; visual servoing; MEMS-based capacitive force sensing technology; RT-CFM; SI-traceable stiffness reference; acquisition architecture; biological specimen; computer vision automation; confocal imaging; dual-stage positioning system; growing plant cells; interactive image; intracellular components; microrobotic platform; morphology; pollen tubes; real-time control; sensing tip; silicon wafer sample; tip growing cells; topography accuracy; visual servoing techniques; Accuracy; Electron tubes; Force; Force measurement; Microscopy; Sensors; Surfaces;
Conference_Titel :
Intelligent Robots and Systems (IROS 2014), 2014 IEEE/RSJ International Conference on
Conference_Location :
Chicago, IL
DOI :
10.1109/IROS.2014.6943118