Anomalous light reflection at the surface of a corrugated thin metal film

Author

Salakhutdinov, Ildar F. ; Sychugov, Vladimir A. ; Tishchenko, Alexander V. ; Usievich, Boris A. ; Parriaux, Olivier ; Pudonin, Fedor A.

Author_Institution

Gen. Phys. Inst., Acad. of Sci., Moscow, Russia

Volume

34

Issue

6

fYear

1998

fDate

6/1/1998 12:00:00 AM

Firstpage

1054

Lastpage

1060

Abstract

The process of excitation of surface electromagnetic waves (SEW´s) in corrugated thin metal film is investigated theoretically and experimentally. The existence of an anomalous increase of the reflection coefficient is demonstrated. The excitation of long-range plasmons in thin metal films opens new possibilities for sensor applications

Keywords

diffraction gratings; light reflection; metallic thin films; optical films; optical sensors; optical waveguides; reflectivity; surface electromagnetic waves; surface plasmons; anomalous increase; anomalous light reflection; corrugated thin metal film surface; diffraction gratings; long-range plasmons; optical sensor applications; optical waveguide gratings; reflection coefficient; surface electromagnetic wave excitation; thin metal films; Corrugated surfaces; Electromagnetic reflection; Electromagnetic waveguides; Fresnel reflection; Optical films; Optical reflection; Optical surface waves; Optical waveguides; Plasmons; Surface waves;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.678604

Filename

678604