• DocumentCode
    1383952
  • Title

    Nearest Feature Space Analysis for Classification

  • Author

    Lu, Jiwen ; Tan, Yap-Peng

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • Volume
    18
  • Issue
    1
  • fYear
    2011
  • Firstpage
    55
  • Lastpage
    58
  • Abstract
    We propose in this letter two new subspace learning methods, called nearest feature space analysis (NFSA) and discriminant nearest feature space analysis (DNFSA), for pattern classification. While many subspace learning algorithms have been proposed in recent years, most of them apply the conventional nearest neighbor (NN) metric to derive the subspace and may not effectively characterize the geometrical information of the samples, especially when the number of training samples per class is limited. In this paper, we propose using the nearest feature space (NFS) metric to seek a NFSA subspace to improve the discriminating power of the subspace for classification. To further enhance the discriminative power of NFSA, we also propose a new DNFSA method to minimize the within-class feature space (FS) distances and maximize the between-class FS distances simultaneously in the derived subspace. Experimental results on face and facial expression recognition are presented to demonstrate the efficacy of the proposed methods.
  • Keywords
    face recognition; image classification; between-class feature space distances; discriminant nearest feature space analysis; facial expression recognition; nearest feature space metric; nearest neighbor metric; pattern classification; subspace learning algorithm; subspace learning method; within-class feature space distances; Artificial neural networks; Databases; Face recognition; Learning systems; Measurement; Principal component analysis; Training; Nearest feature line (NFL); nearest feature space (NFS); pattern classification; subspace learning;
  • fLanguage
    English
  • Journal_Title
    Signal Processing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1070-9908
  • Type

    jour

  • DOI
    10.1109/LSP.2010.2093600
  • Filename
    5640653