DocumentCode
1384205
Title
Tape erase bands measured by MFM compared to MR head cross erase band responses
Author
Pan, Tao ; Kennedy, Angela C. ; Bain, James A. ; Yip, Yung ; Schwarz, Ted
Author_Institution
DSSC, Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume
32
Issue
5
fYear
1996
fDate
9/1/1996 12:00:00 AM
Firstpage
3407
Lastpage
3409
Abstract
The erase bands written on tape by heads with CoZrTa and permalloy poles were compared by using MFM techniques and by measuring MR head responses as the heads were moved in the cross track direction. Measurements were made under conditions of both the top and bottom poles trailing, as well as for two different overwrite frequencies (2f and 4f). From both methods, it was found that the erase band is more dependent on which pole is trailing, than on the write head pole materials. In all cases, the top pole trailing (TPT) case yields narrower erase bands than the bottom pole trailing (BPT) case. The boundaries of the erase band become less distinct when the overwrite frequency increases. The phase difference between adjacent tracks does not play a big role in the case of BPT, but does matter in the case of TPT. The cross erase band profile demonstrates that the transport system is stable enough, and that this method to measure the erase band is feasible in the presence of tape motion
Keywords
magnetic force microscopy; magnetic heads; magnetoresistive devices; microscopy; CoZrTa; CoZrTa pole; FeNi; MFM; MR head cross erase band response; bottom pole trailing; overwrite frequency; permalloy pole; phase difference; tape erase band; top pole trailing; transport system; Crosstalk; Decision support systems; Density measurement; Frequency measurement; Magnetic force microscopy; Magnetic heads; Motion measurement; Servomechanisms; Signal resolution; Tracking;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.538639
Filename
538639
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