DocumentCode :
1384205
Title :
Tape erase bands measured by MFM compared to MR head cross erase band responses
Author :
Pan, Tao ; Kennedy, Angela C. ; Bain, James A. ; Yip, Yung ; Schwarz, Ted
Author_Institution :
DSSC, Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume :
32
Issue :
5
fYear :
1996
fDate :
9/1/1996 12:00:00 AM
Firstpage :
3407
Lastpage :
3409
Abstract :
The erase bands written on tape by heads with CoZrTa and permalloy poles were compared by using MFM techniques and by measuring MR head responses as the heads were moved in the cross track direction. Measurements were made under conditions of both the top and bottom poles trailing, as well as for two different overwrite frequencies (2f and 4f). From both methods, it was found that the erase band is more dependent on which pole is trailing, than on the write head pole materials. In all cases, the top pole trailing (TPT) case yields narrower erase bands than the bottom pole trailing (BPT) case. The boundaries of the erase band become less distinct when the overwrite frequency increases. The phase difference between adjacent tracks does not play a big role in the case of BPT, but does matter in the case of TPT. The cross erase band profile demonstrates that the transport system is stable enough, and that this method to measure the erase band is feasible in the presence of tape motion
Keywords :
magnetic force microscopy; magnetic heads; magnetoresistive devices; microscopy; CoZrTa; CoZrTa pole; FeNi; MFM; MR head cross erase band response; bottom pole trailing; overwrite frequency; permalloy pole; phase difference; tape erase band; top pole trailing; transport system; Crosstalk; Decision support systems; Density measurement; Frequency measurement; Magnetic force microscopy; Magnetic heads; Motion measurement; Servomechanisms; Signal resolution; Tracking;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.538639
Filename :
538639
Link To Document :
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