DocumentCode :
1384337
Title :
Application of continuous wavelet transform for study of voltage flicker-generated signals
Author :
Huang, Shyh-Jier ; Hsieh, Cheng-Tao
Author_Institution :
Nat. Cheng Kung Univ., Tainan, Taiwan
Volume :
36
Issue :
3
fYear :
2000
fDate :
7/1/2000 12:00:00 AM
Firstpage :
925
Lastpage :
932
Abstract :
An application of continuous wavelet transform (CWT) for the analysis of voltage flicker-generated signals is proposed. With the time-frequency localization characteristics embedded in wavelets, the time and frequency information of a waveform can be integrally presented, thereby enhancing the monitoring of voltage flicker-generated signals at different time intervals. The Morlet wavelet has been selected as the basis function for the CWT in the proposed method. The merit of the method lies in that the signal component at any frequency of interest can be more easily monitored than by discrete wavelet transform (DWT). The high frequency required in the voltage flicker study can be also comfortably accomplished. This approach has been applied to investigate various simulated voltage flicker-generated signals, and inspect the data recorded from the actual are furnace operation. Test results help solidify the practicality and advantages of the proposed method for the applications
Keywords :
digital simulation; flicker noise; signal processing; voltage measurement; wavelet transforms; Morlet wavelet; continuous wavelet transform; discrete wavelet transform; simulated voltage flicker-generated signals; time-frequency localization characteristics; voltage flicker modelling; voltage flicker-generated signals; Continuous wavelet transforms; Discrete wavelet transforms; Furnaces; Monitoring; Signal analysis; Testing; Time frequency analysis; Voltage fluctuations; Wavelet analysis; Wavelet transforms;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9251
Type :
jour
DOI :
10.1109/7.869511
Filename :
869511
Link To Document :
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