DocumentCode :
1384458
Title :
Measuring core losses in thin film heads
Author :
Payne, Alexander ; Cain, William ; Hempstead, Robert ; McCrea, Gary
Author_Institution :
Censtor Corp., San Jose, CA, USA
Volume :
32
Issue :
5
fYear :
1996
fDate :
9/1/1996 12:00:00 AM
Firstpage :
3518
Lastpage :
3520
Abstract :
Increasing data rates are requiring magnetic transducers to perform at higher frequencies. “Core losses”-the combined effect of eddy current losses, damped domain wall motion, and decreasing rotation susceptibility, act to reduce yoke permeance at high frequencies. In this work, we describe a technique for measuring core loss and demonstrate its application to a variety of heads. The method involves least-squares fitting measured head impedance vs. frequency spectra to the response from an equivalent magnetic circuit having a complex and frequency-dependent inductance. The result is a description how the complex inductance varies with frequency, thereby characterizing the core loss
Keywords :
eddy current losses; equivalent circuits; inductance; least squares approximations; loss measurement; magnetic circuits; magnetic heads; magnetic leakage; magnetic thin film devices; magnetic variables measurement; complex frequency-dependent inductance; core loss measurement; damped domain wall motion; eddy current losses; equivalent magnetic circuit; head impedance/frequency spectra; least-squares fitting; magnetic transducers; rotation susceptibility; thin film heads; yoke permeance; Core loss; Eddy currents; Frequency; Inductance; Loss measurement; Magnetic domain walls; Magnetic domains; Magnetic heads; Transducers; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.538676
Filename :
538676
Link To Document :
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