Title :
The measurement of the small-signal characteristics of transistors
Author :
Cooke-Yarborough, E.H. ; Florida, C.D. ; Stephen, H.
fDate :
9/1/1954 12:00:00 AM
Abstract :
The paper describes the measurement of the small-signal characteristics of point-type transistors over a wide range of emitter currents, including those of less than 1 ¿A. The theoretical significance of the results is considered briefly, and it is shown that the characteristics at low emitter currents are important in the design of reliable but sensitive triggered circuits.
Keywords :
characteristics measurement; transistors;
Journal_Title :
Proceedings of the IEE - Part III: Radio and Communication Engineering
DOI :
10.1049/pi-3.1954.0071
