Title :
High frequency magnetization response observed at the air-bearing surfaces of thin film heads
Author :
Liu, Francis H. ; Tong, Hua-Chng ; Milosvlasky, Lena
Author_Institution :
Read-Rite Corp., Fremont, CA, USA
fDate :
9/1/1996 12:00:00 AM
Abstract :
Magnetization response during high frequency and high amplitude write current excitations at the air-bearing surfaces (ABS) of thin film inductive and MR write heads were observed by using a Scanning Kerr Effect Microscope. Under certain excitation conditions, bubble-like dynamic domain walls that separate the regions of 180° out-of-phase magnetization reversals were observed predominately at the ABS of trailing poles (P2). This magnetization reversal mechanism is believed to be introduced by the combined effects of eddy current damping and local magnetization saturation, and is consistent with the model proposed by Wood and Williams (1990)
Keywords :
Kerr magneto-optical effect; eddy currents; magnetic domain walls; magnetic heads; magnetic thin film devices; magnetisation reversal; magnetoresistive devices; 180° out-of-phase magnetization reversals; MR write heads; Wood Williams model; air-bearing surfaces; bubble-like dynamic domain walls; eddy current damping; high amplitude write current excitation; high frequency magnetization response; local magnetization saturation; magnetization reversal mechanism; magneto-optic polar Kerr effect; scanning Kerr effect microscope; thin film heads; thin film inductive heads; trailing poles; Damping; Degradation; Eddy currents; Frequency; Kerr effect; Magnetic force microscopy; Magnetic heads; Magnetization reversal; Testing; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on